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Beilstein J. Nanotechnol. 2020, 11, 1504–1515, doi:10.3762/bjnano.11.133
Figure 1: Mass spectra of a natural zircon sample before rastering with the primary beam (red) and after rast...
Figure 2: a) Backscattered electron (BSE) map of the sample, SIMS location outlined in red; b) raw and proces...
Figure 3: The calculated sputtering yield as a function of the atomic number for a 10 kV primary Ne beam impa...
Figure 4: Reflected-light micrograph of the analysed Spodumene grain. The grain has relatively unaltered regi...
Figure 5: a) Raw (solid line), b) 32 × 32 regridded (dotted line) and c) 64 × 64 regridded (dashed line) maps...
Figure 6: The relative δ7Li ratios for regions within the same grain of Spodumene as in Figure 4 and Figure 5. Four connected...
Figure 7: a) Backscatter electron image of the region of interest. The red square shows the region mapped usi...
Figure 8: Count rates relative to background count rates for 6Li (red, 3 μg/g) and 7Li (green, 37 μg/g) for t...
Figure 9: The relative δ7Li ratios for regions within the same grain of Spodumene. Values are not calibrated ...
Figure 10: a) Examples of deformed cleavage planes in a Li-rich biotite mica shown parallel to the c-axis and ...